| Optical probing (EOFM/TRI): a large set of complementary applications for ultimate VLSI P Perdu, G Bascoul, S Chef, G Celi, K Sanchez Proceedings of the 20th IEEE International Symposium on the Physical and …, 2013 | 23 | 2013 |
| Descrambling of embedded SRAM using a laser probe S Chef, CT Chua, JY Tay, YW Siah, S Bhasin, J Breier, CL Gan 2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018 | 12 | 2018 |
| Extensive laser fault injection profiling of 65 nm FPGA J Breier, W He, S Bhasin, D Jap, S Chef, HG Ong, CL Gan Journal of Hardware and Systems Security 1, 237-251, 2017 | 9 | 2017 |
| Frequency mapping in dynamic light emission with wavelet transform S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak Microelectronics Reliability 53 (9-11), 1387-1392, 2013 | 9 | 2013 |
| Filtering and emission area identification in the Time Resolved Imaging data S Chef, S Jacquir, S Binczak, K Sanchez, P Perdu International Symposium for Testing and Failure Analysis 39791, 264-272, 2012 | 9 | 2012 |
| Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak Journal of Electronic Imaging 24 (1), 013019-013019, 2015 | 7 | 2015 |
| New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI S Chef, P Perdu, G Bascoul, S Jacquir, K Sanchez, S Binczak Proceedings of the 20th IEEE International Symposium on the Physical and …, 2013 | 7 | 2013 |
| Quantitative study of photoelectric laser stimulation for logic state imaging in embedded SRAM S Chef, CT Chua, JY Tay, CL Gan International Symposium for Testing and Failure Analysis 84215, 154-162, 2021 | 6 | 2021 |
| VLSI for space applications—Single event effect investigation and optical analysis on an integrated laser platform S Chef, CT Chua, YW Siah, P Perdu, CL Gan, SH Tan, LS Koh International Symposium for Testing and Failure Analysis 81504, 621-630, 2017 | 6 | 2017 |
| Unsupervised learning for signal mapping in dynamic photon emission S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak, CL Gan Microelectronics Reliability 55 (9-10), 1564-1568, 2015 | 5 | 2015 |
| Automatic emission spots identification in static and dynamic imaging by research of local maxima A Boscaro, S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak International Symposium for Testing and Failure Analysis 30927, 322-326, 2014 | 4 | 2014 |
| Cluster matching in time resolved imaging for VLSI analysis S Chef, S Jacquir, P Perdu, K Sanchez, S Binczak Proceedings of the 21th International Symposium on the Physical and Failure …, 2014 | 4 | 2014 |
| Pattern image enhancement by extended depth of field S Chef, B Billiot, S Jacquir, K Sanchez, P Perdu, S Binczak Microelectronics Reliability 54 (9-10), 2099-2104, 2014 | 3 | 2014 |
| Investigation on Data Retrieval in Emerging Non-Volatile Memory Devices Using Conductive Probe Atomic Force Microscopy JY Tay, J Cheah, S Chef, XM Zeng, Q Liu, CL Gan 2023 IEEE International Symposium on the Physical and Failure Analysis of …, 2023 | 2 | 2023 |
| Embedded-EEPROM descrambling via laser-based techniques–A case study on AVR MCU S Chef, CC Tah, JY Tay, J Cheah, CL Gan 2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), 1-8, 2022 | 2 | 2022 |
| Integrating pulsed laser for a galvo mirror based SEE scanning microscope with optical failure analysis capabilities CT Chua, S Chef, K Sanchez, G Bascoul, P Perdu, SH Tan, CL Gan 2018 International Conference on Radiation Effects of Electronic Devices …, 2018 | 2 | 2018 |
| Spatial correction in dynamic photon emission by affine transformation matrix estimation S Chef, S Jacquir, P Perdu, K Sanchez, S Binczak Proceedings of the 21th International Symposium on the Physical and Failure …, 2014 | 2 | 2014 |
| Security evaluation of microcontrollers: a case study in smart watches X Zeng, Q Liu, CT Chua, S Chef, CL Gan 2023 IEEE International Symposium on the Physical and Failure Analysis of …, 2023 | 1 | 2023 |
| Automated profiling method for laser fault injection in FPGAs J Breier, W He, S Bhasin, D Jap, S Chef, HG Ong, CL Gan Automated Methods in Cryptographic Fault Analysis, 301-325, 2019 | 1 | 2019 |
| Automatic localization of signal sources in photon emission images for integrated circuit analysis A Boscaro, S Jacquir, S Chef, K Sanchez, P Perdu, S Binczak Signal, Image and Video Processing 12, 775-782, 2018 | 1 | 2018 |
