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Co-authors
- A. Aydin AlatanDept. of EE Eng., Center for Image Analysis (OGAM), METUVerified email at metu.edu.tr
- Savaş ÖzkanSamsung Research UKVerified email at samsung.com
- Medeni SoysalTÜBİTAK Space Technologies Research InstituteVerified email at tubitak.gov.tr
- Mehmet Ali ArabacıTübitak Space Technologies Research InstituteVerified email at tubitak.gov.tr
- Berker LogogluKuartisVerified email at kuartis.com
- İlkay AtılEngineering Manager at TogglVerified email at ceng.metu.edu.tr
- Gozde Bozdagi AkarProfessor at Electrical and Electrical Eng, METUVerified email at metu.edu.tr
- Engin TolaAurvis, Alumni CVLab, École Polytechnique Fédérale de Lausanne (EPFL)Verified email at a3.epfl.ch
- Prof. Dr. Murat AşkarIzmir University of Economics, Department of Electrical & Electronics EngineeringVerified email at ieu.edu.tr
- Ozan OktayMicrosoft Research CambridgeVerified email at microsoft.com
- Özlem BirgülAnkara University; Faculty of EngineeringVerified email at ankara.edu.tr
- Ufuk SakaryaYildiz Technical University, Department of Electronics and Communication EngineeringVerified email at yildiz.edu.tr