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Co-authors
- Dan Keun SungProfessor Emeritus, School of Electrical Engineering, Korea Adv. Inst. of Sci. & Tech(KAIST).Verified email at kaist.ac.kr
- Jae Kyun KwonAssociate Professor, Dept. of Electronic Engineering, Yeungnam UniversityVerified email at yumail.ac.kr
- Ho Young HwangProfessor, School of Computer and Information Engineering, Kwangwoon UniversityVerified email at kw.ac.kr
- Sungho MoonIntel Corp.Verified email at intel.com
- Soon Young YoonSamsung ElectronicsVerified email at samsung.com
- Yongjun KwakSystems Engineer, Intel CorporationVerified email at intel.com
- Ho-Shin ChoProfessor of Electrical Engineering, Kyungpook National UniversityVerified email at ee.knu.ac.kr
- Hyunseok LeeProfessor or Electronics and Comunications Engineering in Kwangwoon UniversityVerified email at kw.ac.kr
- Junsu KimKorea Polytechnic UniversityVerified email at ieee.org
- Chae-Bong SohnDept. of Electronics and Communications Eng., Kwangwoon UniversityVerified email at kw.ac.kr