| Aging-aware gate-level modeling for circuit reliability analysis Z Zhang, R Wang, X Shen, D Wu, J Zhang, Z Zhang, J Wang, R Huang IEEE Transactions on Electron Devices 68 (9), 4201-4207, 2021 | 17 | 2021 |
| A parallel bitstream generator for stochastic computing Y Zhang, R Wang, X Zhang, Z Zhang, J Song, Z Zhang, Y Wang, R Huang 2019 Silicon Nanoelectronics Workshop (SNW), 1-2, 2019 | 17 | 2019 |
| Circuit reliability comparison between stochastic computing and binary computing Z Zhang, R Wang, Z Zhang, Y Zhang, S Guo, R Huang IEEE Transactions on Circuits and Systems II: Express Briefs 67 (12), 3342-3346, 2020 | 14 | 2020 |
| Reliability-enhanced circuit design flow based on approximate logic synthesis Z Zhang, R Wang, Z Zhang, R Huang, C Meng, W Qian, Z Zhou Proceedings of the 2020 on Great Lakes Symposium on VLSI, 71-76, 2020 | 9 | 2020 |
| Comprehensive study on the “Anomalous” complex RTN in advanced multi-fin bulk FinFET technology J Zhang, Z Zhang, R Wang, Z Sun, Z Zhang, S Guo, R Huang 2018 IEEE International Electron Devices Meeting (IEDM), 17.3. 1-17.3. 4, 2018 | 8 | 2018 |
| Eventtimer: fast and accurate event-based dynamic timing analysis Z Zhang, Z Guo, Y Lin, R Wang, R Huang 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 945-950, 2022 | 7 | 2022 |
| Efficient aging-aware standard cell library characterization based on sensitivity analysis X Zhang, Z Zhang, Y Lin, Z Ji, R Wang, R Huang IEEE Transactions on Circuits and Systems II: Express Briefs 70 (2), 721-725, 2022 | 6 | 2022 |
| A 28-nm 198.9-tops/w fault-tolerant stochastic computing neural network processor Y Hu, Y Zhang, R Wang, Z Zhang, J Song, X Tang, W Qian, Y Wang, ... IEEE Solid-State Circuits Letters 5, 198-201, 2022 | 6 | 2022 |
| An energy-efficient mixed-signal parallel multiply-accumulate (MAC) engine based on stochastic computing X Zhang, J Song, Y Wang, Y Zhang, Z Zhang, R Wang, R Huang 2019 IEEE 13th International Conference on ASIC (ASICON), 1-4, 2019 | 6 | 2019 |
| Investigation of the off-state degradation in advanced FinFET technology—Part I: Experiments and analysis Z Sun, Z Wang, R Wang, L Zhang, J Zhang, Z Zhang, J Song, D Wang, ... IEEE Transactions on Electron Devices 70 (3), 914-920, 2023 | 5 | 2023 |
| AVATAR: an aging-and variation-aware dynamic timing analyzer for application-based DVAFS Z Zhang, Z Guo, Y Lin, R Wang, R Huang Proceedings of the 59th ACM/IEEE Design Automation Conference, 841-846, 2022 | 4 | 2022 |
| Investigation of the off-state degradation in advanced FinFET technology—Part II: Compact aging model and impact on circuits Z Sun, Z Wang, R Wang, L Zhang, J Zhang, Z Zhang, J Song, D Wang, ... IEEE Transactions on Electron Devices 70 (3), 921-927, 2023 | 3 | 2023 |
| Cross-layer design for reliability in advanced technology nodes: An EDA perspective R Wang, Z Zhang, Z Sun, Z Guo, Y Lin, R Huang 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit …, 2022 | 3 | 2022 |
| Can emerging computing paradigms help enhancing reliability towards the end of technology roadmap? R Wang, Z Zhang, Y Zhang, Y Hu, Y Sun, W Qian, R Huang 2021 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2021 | 3 | 2021 |
| Transient self-heating effects on mixed-mode hot carrier and bias temperature instability in FinFETs: Experiments and modeling Z Sun, W Luo, Y Jiao, Z Zhang, J Song, L Zhang, Z Wang, J Zhang, ... IEEE Transactions on Electron Devices, 2023 | 2 | 2023 |
| Modulation and Demodulation of Digital Frequency Shift Keying System Based on Spin Torque Nano Oscillator with Voltage Controlled Magnetic Anisotropy Effect L Zeng, Z Zhang, H Chen, T Gao, D Zhang, M Long, Y Zhang, W Zhao 2019 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2019 | 2 | 2019 |
| Reconfigurable Logic based on Voltage-Controlled Magnetic Tunnel Junction (VC-MTJ) for Stochastic Computing Z Zhang, Y Zhang, R Wang, L Zeng, R Huang 2018 14th IEEE International Conference on Solid-State and Integrated …, 2018 | 2 | 2018 |
| AVATAR: An Aging-and Variation-Aware Dynamic Timing Analyzer for Error-Efficient Computing Z Zhang, Z Guo, Y Lin, M Li, R Wang, R Huang IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023 | 1 | 2023 |
| Error correction scheme for reliable rram-based in-memory computing Y Hu, K Cheng, Z Zhang, R Wang, Y Wang, R Huang 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2021 | 1 | 2021 |
| The Dawn of AI-Native EDA: Promises and Challenges of Large Circuit Models L Chen, Y Chen, Z Chu, W Fang, TY Ho, Y Huang, S Khan, M Li, X Li, ... arXiv preprint arXiv:2403.07257, 2024 | | 2024 |
Runsheng WangPeking UniversityVerified email at pku.edu.cn
