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Dirmanto Jap
Dirmanto Jap
Research Scientist
Verified email at ntu.edu.sg
Title
Cited by
Cited by
Year
{CSI}{NN}: Reverse engineering of neural network architectures through electromagnetic side channel
L Batina, S Bhasin, D Jap, S Picek
28th USENIX Security Symposium (USENIX Security 19), 515-532, 2019
2902019
Practical fault attack on deep neural networks
J Breier, X Hou, D Jap, L Ma, S Bhasin, Y Liu
Proceedings of the 2018 ACM SIGSAC Conference on Computer and Communications …, 2018
1502018
Mind the portability: A warriors guide through realistic profiled side-channel analysis
S Bhasin, A Chattopadhyay, A Heuser, D Jap, S Picek, R Ranjan
NDSS 2020-Network and Distributed System Security Symposium, 1-14, 2020
822020
Toward threat of implementation attacks on substation security: Case study on fault detection and isolation
A Chattopadhyay, A Ukil, D Jap, S Bhasin
IEEE Transactions on Industrial Informatics 14 (6), 2442-2451, 2017
772017
SNIFF: reverse engineering of neural networks with fault attacks
J Breier, D Jap, X Hou, S Bhasin, Y Liu
IEEE Transactions on Reliability 71 (4), 1527-1539, 2021
672021
Laser profiling for the back-side fault attacks: with a practical laser skip instruction attack on AES
J Breier, D Jap, CN Chen
Proceedings of the 1st ACM Workshop on Cyber-Physical System Security, 99-103, 2015
662015
CSI neural network: Using side-channels to recover your artificial neural network information
L Batina, S Bhasin, D Jap, S Picek
arXiv preprint arXiv:1810.09076, 2018
642018
A framework to counter statistical ineffective fault analysis of block ciphers using domain transformation and error correction
S Saha, D Jap, DB Roy, A Chakraborty, S Bhasin, D Mukhopadhyay
IEEE Transactions on Information Forensics and Security 15, 1905-1919, 2019
422019
Supervised and unsupervised machine learning for side-channel based Trojan detection
D Jap, W He, S Bhasin
2016 IEEE 27th International Conference on Application-specific Systems …, 2016
422016
A survey on fault attacks on symmetric key cryptosystems
A Baksi, S Bhasin, J Breier, D Jap, D Saha
ACM Computing Surveys 55 (4), 1-34, 2022
412022
Support vector regression: exploiting machine learning techniques for leakage modeling
D Jap, M Stöttinger, S Bhasin
Proceedings of the Fourth Workshop on Hardware and Architectural Support for …, 2015
312015
Back to the basics: Seamless integration of side-channel pre-processing in deep neural networks
YS Won, X Hou, D Jap, J Breier, S Bhasin
IEEE Transactions on Information Forensics and Security 16, 3215-3227, 2021
302021
Machine learning and hardware security: Challenges and opportunities
F Regazzoni, S Bhasin, AA Pour, I Alshaer, F Aydin, A Aysu, V Beroulle, ...
Proceedings of the 39th International Conference on Computer-Aided Design, 1-6, 2020
302020
Fault attacks in symmetric key cryptosystems
A Baksi, S Bhasin, J Breier, D Jap, D Saha
Cryptology ePrint Archive, 2020
302020
Non-profiled side-channel attack based on deep learning using picture trace
YS Won, DG Han, D Jap, S Bhasin, JY Park
IEEE Access 9, 22480-22492, 2021
282021
SCADPA: Side-channel assisted differential-plaintext attack on bit permutation based ciphers
J Breier, D Jap, S Bhasin
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2018
282018
SITM: See-in-the-middle side-channel assisted middle round differential cryptanalysis on SPN block ciphers
S Bhasin, J Breier, X Hou, D Jap, R Poussier, SM Sim
IACR Transactions on Cryptographic Hardware and Embedded Systems, 95-122, 2020
262020
On side channel vulnerabilities of bit permutations in cryptographic algorithms
J Breier, D Jap, X Hou, S Bhasin
IEEE Transactions on Information Forensics and Security 15, 1072-1085, 2019
262019
Side channel attack on stream ciphers: a three-step approach to state/key recovery
S Kumar, VA Dasu, A Baksi, S Sarkar, D Jap, J Breier, S Bhasin
IACR Trans. Cryptogr. Hardw. Embed. Syst. 2022 (2), 166-191, 2022
252022
Testing feasibility of back-side laser fault injection on a microcontroller
J Breier, D Jap
Proceedings of the WESS'15: Workshop on Embedded Systems Security, 1-6, 2015
242015
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