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Co-authors
- Shuaicheng LiuUniversity of Electronic Science and Technology of ChinaVerified email at uestc.edu.cn
- Jue WangTencentVerified email at tencent.com
- Haoqiang FanMegviiVerified email at megvii.com
- Ao LuoSouthwest Jiaotong UniversityVerified email at swjtu.edu.cn
- Meng FanmanSchool of Electronic Engineering, University of Electronic Science and Technology of ChinaVerified email at e.ntu.edu.sg
- Bing ZengUniversity of Electronic Science and Technology of ChinaVerified email at uestc.edu.cn
- Qingbo WuUniversity of Electronic Science and Technology of ChinaVerified email at uestc.edu.cn
- Jian SunChief Scientist of Megvii, Managing Director of Megvii ResearchVerified email at megvii.com
- Ping TanHong Kong University of Science and Technology (HKUST)Verified email at ust.hk
- Hongliang LiProfessor of UESTCVerified email at uestc.edu.cn
- Haipeng LIUniversity of Electronic Science and Technology of ChinaVerified email at std.uestc.edu.cn