| Making predictive analog/RF alternate test strategy independent of training set size H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell 2012 IEEE International Test Conference, 1-9, 2012 | 51 | 2012 |
| Smart selection of indirect parameters for DC-based alternate RF IC testing H Ayari, F Azais, S Bernard, M Comte, M Renovell, V Kerzerho, O Potin, ... 2012 IEEE 30th VLSI Test Symposium (VTS), 19-24, 2012 | 46 | 2012 |
| Experimental analysis of the laser-induced instruction skip fault model JM Dutertre, T Riom, O Potin, JB Rigaud Secure IT Systems: 24th Nordic Conference, NordSec 2019, Aalborg, Denmark …, 2019 | 35 | 2019 |
| Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS JM Dutertre, RP Bastos, O Potin, ML Flottes, B Rouzeyre, G Di Natale, ... Microelectronics Reliability 54 (9-10), 2289-2294, 2014 | 35 | 2014 |
| Experimental analysis of the electromagnetic instruction skip fault model A Menu, JM Dutertre, O Potin, JB Rigaud, JL Danger 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 1-7, 2020 | 32 | 2020 |
| Runtime code polymorphism as a protection against side channel attacks D Couroussé, T Barry, B Robisson, P Jaillon, O Potin, JL Lanet IFIP International Conference on Information Security Theory and Practice …, 2016 | 27 | 2016 |
| Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection JM Dutertre, RP Bastos, O Potin, ML Flottes, B Rouzeyre, G Di Natale Microelectronics Reliability 53 (9-11), 1320-1324, 2013 | 24 | 2013 |
| A passive pressure sensor for continuously measuring the intraocular pressure in glaucomatous patients P Auvray, L Rousseau, G Lissorgues, F Soulier, O Potin, S Bernard, ... Irbm 33 (2), 117-122, 2012 | 20 | 2012 |
| Filtering-based CPA: a successful side-channel attack against desynchronization countermeasures KM Abdellatif, D Couroussé, O Potin, P Jaillon Proceedings of the Fourth Workshop on Cryptography and Security in Computing …, 2017 | 15 | 2017 |
| A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC V Kerzérho, S Bernard, F Azaïs, M Comte, O Potin, C Shan, G Bontorin, ... Microelectronics Journal 44 (9), 840-843, 2013 | 14 | 2013 |
| Assessment of on-chip current sensor for detection of thermal-neutron-induced transients RP Bastos, JM Dutertre, MG Trindade, RAC Viera, O Potin, M Letiche, ... IEEE Transactions on Nuclear Science 67 (7), 1404-1411, 2020 | 10 | 2020 |
| On the use of redundancy to reduce prediction error in alternate analog/RF test H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test …, 2012 | 10 | 2012 |
| A CFI verification system based on the RISC-V instruction trace encoder A Zgheib, O Potin, JB Rigaud, JM Dutertre 2022 25th Euromicro Conference on Digital System Design (DSD), 456-463, 2022 | 9 | 2022 |
| Comparison of side-channel leakage on Rich and Trusted Execution Environments P Leignac, O Potin, JB Rigaud, JM Dutertre, S Pontié Proceedings of the Sixth Workshop on Cryptography and Security in Computing …, 2019 | 9 | 2019 |
| Combined fault injection and real-time side-channel analysis for android secure-boot bypassing C Fanjas, C Gaine, D Aboulkassimi, S Pontié, O Potin International Conference on Smart Card Research and Advanced Applications, 25-44, 2022 | 8* | 2022 |
| Experimental analysis of the electromagnetic instruction skip fault model and consequences for software countermeasures JM Dutertre, A Menu, O Potin, JB Rigaud, JL Danger Microelectronics Reliability 121, 114133, 2021 | 7 | 2021 |
| Assessing body built-in current sensors for detection of multiple transient faults RAC Viera, JM Dutertre, ML Flottes, O Potin, G Di Natale, B Rouzeyre, ... Microelectronics Reliability 88, 128-134, 2018 | 6 | 2018 |
| Extending a RISC-V core with an AES hardware accelerator to meet IOT constraints A Zgheib, O Potin, JB Rigaud, JM Dutertre SMACD/PRIME 2021; International Conference on SMACD and 16th Conference on …, 2021 | 5 | 2021 |
| Validation of single bbics architecture in detecting multiple faults R Viera, RP Bastos, J Dutertre, O Potin, ML Flottes, G Di Natale, ... ATS, Nov, 2015 | 5 | 2015 |
| Adaptive LUT-based system for in situ ADC auto-correction S Bernard, F Azaïs, M Comte, O Potin, V Kerzérho, M Renovell 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test …, 2010 | 5 | 2010 |
