| CRC Press Boca Raton K Iniewski, K Yallup FL, USA, 2013 | 382 | 2013 |
| Noncontact wafer probe using wireless probe cards CV Sellathamby, MM Reja, L Fu, B Bai, E Reid, SH Slupsky, IM Filanovsky, ... IEEE International Conference on Test, 2005., 6 pp.-452, 2005 | 301 | 2005 |
| Error control coding in low-power wireless sensor networks: When is ECC energy-efficient? SL Howard, C Schlegel, K Iniewski, K Iniewski EURASIP Journal on Wireless Communications and Networking 2006, 1-14, 2006 | 281 | 2006 |
| Smart grid applications, communications, and security LT Berger, K Iniewski John Wiley & Sons, 2012 | 179 | 2012 |
| Characterization of large cadmium zinc telluride crystals grown by traveling heater method H Chen, SA Awadalla, K Iniewski, PH Lu, F Harris, J Mackenzie, ... Journal of Applied Physics 103 (1), 2008 | 176 | 2008 |
| Medical imaging: principles, detectors, and electronics K Iniewski John Wiley & Sons, 2009 | 163 | 2009 |
| Measurements of charge sharing in small pixel CdTe detectors MC Veale, SJ Bell, DD Duarte, A Schneider, P Seller, MD Wilson, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2014 | 128 | 2014 |
| Mems: fundamental technology and applications V Choudhary, K Iniewski CRC Press, 2017 | 107 | 2017 |
| CZT detector technology for medical imaging K Iniewski Journal of Instrumentation 9 (11), C11001, 2014 | 105 | 2014 |
| VLSI circuits for biomedical applications K Iniewski Artech House, 2008 | 98 | 2008 |
| Wireless technologies: circuits, systems, and devices K Iniewski CRC press, 2017 | 95 | 2017 |
| Modeling charge-sharing effects in pixellated CZT detectors K Iniewski, H Chen, G Bindley, I Kuvvetli, C Budtz-Jorgensen 2007 IEEE Nuclear Science Symposium Conference Record 6, 4608-4611, 2007 | 93 | 2007 |
| Radiation effects in semiconductors K Iniewski CRC press, 2018 | 87 | 2018 |
| Smart sensors for industrial applications K Iniewski CRC Press, 2017 | 72 | 2017 |
| CZT sensors for Computed Tomography: From crystal growth to image quality K Iniewski Journal of Instrumentation 11 (12), C12034, 2016 | 70 | 2016 |
| New technique for the characterization of Si/SiGe layers using heterostructure MOS capacitors SP Voinigescu, K Iniewski, R Lisak, CAT Salama, JP Noel, DC Houghton Solid-state electronics 37 (8), 1491-1501, 1994 | 68 | 1994 |
| Characterisation of Redlen high-flux CdZnTe B Thomas, MC Veale, MD Wilson, P Seller, A Schneider, K Iniewski Journal of Instrumentation 12 (12), C12045, 2017 | 66 | 2017 |
| Recent advances and future trends in low power wireless systems for medical applications KA Townsend, JW Haslett, TKK Tsang, MN El-Gamal, K Iniewski Fifth International Workshop on System-on-Chip for Real-Time Applications …, 2005 | 62 | 2005 |
| MOS varactor structure with engineered voltage control range K Iniewski, SC Magierowski US Patent 6,407,412, 2002 | 62 | 2002 |
| Analytical modeling of threshold voltages in p-channel Si/SiGe/Si MOS structures K Iniewski, S Voinigescu, J Atcha, CAT Salama Solid-state electronics 36 (5), 775-783, 1993 | 61 | 1993 |
Rafal DlugoszBydgoszcz University of Science and Technology, Bydgoszcz, PolandVerified email at pbs.edu.pl
