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Co-authors
- Dongbo MinComputer Science and Engineering, Ewha Womans University, KoreaVerified email at ewha.ac.kr
- Seungryong KimAssociate Professor, KAISTVerified email at kaist.ac.kr
- Bumsub HamYonsei UniversityVerified email at yonsei.ac.kr
- Youngjung KimAgency for Defense DevelopmentVerified email at add.re.kr
- Sunghwan ChoiLG Electronics, Yonsei UniversityVerified email at yonsei.ac.kr
- Changjae OhQueen Mary University of LondonVerified email at qmul.ac.uk
- Hansung KimAssociate Professor, University of SouthamptonVerified email at soton.ac.uk
- Stephen LinMicrosoft Research AsiaVerified email at microsoft.com
- Yongtae KimSamsung ElectronicsVerified email at samsung.com
- Minh N. DoProfessor, University of Illinois at Urbana-Champaign and VinUniversityVerified email at illinois.edu
- Xingang LiuUniversity of Electronic Science and Techology of ChinaVerified email at uestc.edu.cn
- Jiangbo LuSmartMore, ADSC of UIUC, K.U.LeuvenVerified email at adsc.com.sg
- Itaru KitaharaUniversity of TsukubaVerified email at image.iit.tsukuba.ac.jp
- Wooyoung JangElectronics and Electrical Engineering, Dankook UniversityVerified email at dankook.ac.kr
- Sung-Kyu KimKorea Institute of Science and TechnologyVerified email at kist.re.kr
- LEO HEECHUL HAHNEVIVO , Samsung ElectronicsVerified email at vivo.com